Kopanski, Joseph: search on Z-Library

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1

[AIP FRONTIERS OF CHARACTERIZATION AND METROLOGY FOR NANOELECTRONICS: 2009 - Albany (New York) (11–15 May 2009)] AIP Conference Proceedings - Advanced Capacitance Metrology for Nanoelectronic Device Characterization

Richter, Curt A., Kopanski, Joseph J., Jiang, Chong, Wang, Yicheng, Afridi, M. Yaqub, Zhu, Xiaoxiao, Ioannou, D. E., Li, Qiliang, Secula, Erik M., Seiler, David G., Khosla, Rajinder P., Herr, Dan, Mic

Year:

2009

Language:

english

File:

PDF, 2.40 MB

english, 2009

2

[IEEE 2014 Conference on Precision Electromagnetic Measurements (CPEM 2014) - Rio de Janeiro, Brazil (2014.8.24-2014.8.29)] 29th Conference on Precision Electromagnetic Measurements (CPEM 2014) - Electrical scanning probe microscopes to address industrial nano-metrology needs of integrated circuits and nanoelectronic devices

Kopanski, Joseph J.

Year:

2014

Language:

english

File:

PDF, 174 KB

english, 2014

3

Patient education initiatives at the Canadian Memorial Chiropractic College

Joseph J Piccininni, Christine C Johnston, Deborah R Kopansky-Giles, Susan J Robinson

Journal:

Journal of Manipulative and Physiological Therapeutics

Year:

2000

Language:

english

File:

PDF, 371 KB

english, 2000

4

Boron-implanted 6H-SiC diodes

Ghezzo, Mario, Brown, Dale M., Downey, Evan, Kretchmer, James, Kopanski, Joseph J.

Journal:

Applied Physics Letters

Year:

1993

Language:

english

File:

PDF, 655 KB

english, 1993

5

[AIP FRONTIERS OF CHARACTERIZATION AND METROLOGY FOR NANOELECTRONICS: 2009 - Albany (New York) (11–15 May 2009)] AIP Conference Proceedings - Enhanced Spatial Resolution Scanning Kelvin Force Microscopy Using Conductive Carbon Nanotube Tips

Kopanski, Joseph J., McClure, Paul, Mancevski, Vladimir, Secula, Erik M., Seiler, David G., Khosla, Rajinder P., Herr, Dan, Michael Garner, C., McDonald, Robert, Diebold, Alain C.

Year:

2009

Language:

english

File:

PDF, 1.08 MB

english, 2009

6

Precise Alignment of Single Nanowires and Fabrication of Nanoelectromechanical Switch and Other Test Structures

Li, Qiliang, Koo, Sang-Mo, Richter, Curt A., Edelstein, Monica D., Bonevich, John E., Kopanski, Joseph J., Suehle, John S., Vogel, Eric M.

Journal:

IEEE Transactions on Nanotechnology

Year:

2007

Language:

english

File:

PDF, 1.55 MB

english, 2007

7

Rapid and Accurate C-V Measurements

Kim, Ji-Hong, Shrestha, Pragya R., Campbell, Jason P., Ryan, Jason T., Nminibapiel, David, Kopanski, Joseph J., Cheung, Kin P.

Journal:

IEEE Transactions on Electron Devices

Year:

2016

Language:

english

File:

PDF, 1.15 MB

english, 2016

8

[IEEE 2012 IEEE 12th International Conference on Nanotechnology (IEEE-NANO) - Birmingham, United Kingdom (2012.08.20-2012.08.23)] 2012 12th IEEE International Conference on Nanotechnology (IEEE-NANO) - Metrology for nanosystems and nanoelectronics reliability assessments

Obeng, Yaw S., Okoro, Chukwudi A., Kopanski, Joseph J.

Year:

2012

Language:

english

File:

PDF, 732 KB

english, 2012

9

Silicon nanowire on oxide/nitride/oxide for memory application

Li, Qiliang, Zhu, Xiaoxiao, Xiong, Hao D, Koo, Sang-Mo, Ioannou, D E, Kopanski, Joseph J, Suehle, J S, Richter, C A

Journal:

Year:

2007

Language:

english

File:

PDF, 939 KB

english, 2007

10

Scanning capacitance microscopy applied to two-dimensional dopant profiling of semiconductors

Joseph J. Kopanski, Jay F. Marchiando, Jeremiah R. Lowney

Journal:

Materials Science and Engineering: B

Year:

1997

Language:

english

File:

PDF, 617 KB

english, 1997

11

Subsurface imaging of metal lines embedded in a dielectric with a scanning microwave microscope

You, Lin, Ahn, Jung-Joon, Obeng, Yaw S, Kopanski, Joseph J

Journal:

Journal of Physics D Applied Physics

Year:

2016

Language:

english

File:

PDF, 2.82 MB

english, 2016

12

Determination of surface barrier height and surface state density in GaN films grown on sapphire substrates

Park, Seong-Eun, Kopanski, Joseph J., Kang, Youn-Seon, Robins, Lawrence H., Shin, Hyun-Keel

Journal:

MRS Proceedings

Year:

2004

Language:

english

File:

PDF, 115 KB

english, 2004

13

ECS Transactions [ECS 219th ECS Meeting - Montreal, QC, Canada (May 1 - May 6, 2011)] - Flexible Memristors Fabricated through Sol-Gel Hydrolysis

Tedesco, Joseph L., Gergel-Hackett, Nadine, Stephey, Laurie, Herzing, Andrew, Hernández-Mora, Madelaine, Kopanski, Joseph, Hacker, Christina, Richter, Curt

Year:

2011

Language:

english

File:

PDF, 1.02 MB

english, 2011

14

Influence of Metal–MoS 2 Interface on MoS 2 Transistor Performance: Comparison of Ag and Ti Contacts

Yuan, Hui, Cheng, Guangjun, You, Lin, Li, Haitao, Zhu, Hao, Li, Wei, Kopanski, Joseph J., Obeng, Yaw S., Hight Walker, Angela R., Gundlach, David J., Richter, Curt A., Ioannou, Dimitris E., Li, Qilian

Journal:

ACS Applied Materials & Interfaces

Year:

2015

Language:

english

File:

PDF, 3.71 MB

english, 2015

15

AIP Conference Proceedings [AIP FRONTIERS OF CHARACTERIZATION AND METROLOGY FOR NANOELECTRONICS: 2011 - Grenoble (France) (23–26 May 2011)] - Enhanced Spatial Resolution Electrical Scanning Probe Microscopy By Using Carbon Nanotube Terminated Tips

Kopanski, Joseph J., Sitnitsky, Ilona, Vartanian, Victor, McClure, Paul, Mancevski, Vladimir, Seiler, David G., Diebold, Alain C., McDonald, Robert, Chabli, Amal, Secula, Erik M.

Year:

2011

Language:

english

File:

PDF, 485 KB

english, 2011

16

High-spatial-resolution resistivity mapping applied to mercury cadmium telluride

Kopanski, Joseph J.

Journal:

Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures

Year:

1992

Language:

english

File:

PDF, 871 KB

english, 1992

17

SnTe field effect transistors and the anomalous electrical response of structural phase transition

Li, Haitao, Zhu, Hao, Yuan, Hui, You, Lin, Richter, Curt A., Kopanski, Joseph J., Zhao, Erhai, Li, Qiliang

Journal:

Applied Physics Letters

Year:

2014

Language:

english

File:

PDF, 855 KB

english, 2014

18

[IEEE 2015 International Conference on Microelectronic Test Structures (ICMTS) - Tempe, AZ (2015.3.23-2015.3.26)] Proceedings of the 2015 International Conference on Microelectronic Test Structures - Electromagnetic field test structure chip for back end of the line metrology

Lin You,, Jung-Joon Ahn,, Hitz, Emily, Michelson, Jonathon, Yaw Obeng,, Kopanski, Joseph

Year:

2015

Language:

english

File:

PDF, 1.02 MB

english, 2015

19

SPIE Proceedings [SPIE SPIE NanoScience + Engineering - San Diego, California (Sunday 1 August 2010)] Instrumentation, Metrology, and Standards for Nanomanufacturing IV - Conductive carbon nanotubes for semiconductor metrology

Vartanian, Victor, Postek, Michael T., McClure, Paul, Mancevski, Vladimir, Kopanski, Joseph J., Rack, Philp D., Sitnitsky, Ilona, Bresin, Matthew D., LaBella, Vince, Dunn, Kathleen

Year:

2010

Language:

english

File:

PDF, 1.10 MB

english, 2010

20

Surface photovoltage spectroscopy of minority carrier diffusion lengths in undoped and Si-doped GaN epitaxial films

Seong-Eun Park, Joseph J. Kopanski, Youn-Seon Kang, Lawrence H. Robins

Journal:

physica status solidi (c)

Year:

2005

Language:

english

File:

PDF, 216 KB

english, 2005

21

[IEEE 2009 IEEE International Conference on Microelectronic Test Structures (ICMTS) - Oxnard, CA, USA (2009.03.30-2009.04.2)] 2009 IEEE International Conference on Microelectronic Test Structures - Test Chip to Evaluate Measurement Methods for Small Capacitances

Kopanski, Joseph J., Afridi, M. Yaqub, Jiang, Chong, Richter, Curt A.

Year:

2009

Language:

english

File:

PDF, 4.73 MB

english, 2009

22

[ECS 213th ECS Meeting - Phoenix, AZ (May 18 - May 23, 2008)] ECS Transactions - Scanning Probe Microscopy for Dielectric and Metal Characterization

Kopanski, Joseph J., Walker, Thomas R.

Year:

2008

Language:

english

File:

PDF, 299 KB

english, 2008

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